fourier infrared spectrometer (Rigaku Corporation)
99
Structured Review
Rigaku Corporation
fourier infrared spectrometer

Fourier Infrared Spectrometer, supplied by Rigaku Corporation, used in various techniques. Bioz Stars score: 99/100, based on 44197 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/fourier+infrared+spectrometer+smartlab+9/SmartLab/pmc09388583-163-6-11
Average 99 stars, based on 44197 article reviews

Fourier Infrared Spectrometer, supplied by Rigaku Corporation, used in various techniques. Bioz Stars score: 99/100, based on 44197 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/fourier+infrared+spectrometer+smartlab+9/SmartLab/pmc09388583-163-6-11
Average 99 stars, based on 44197 article reviews
fourier infrared spectrometer - by Bioz Stars,
2026-10
99/100 stars
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1) Product Images from "High-performance piezoelectric composites via β phase programming"
Article Title: High-performance piezoelectric composites via β phase programming
Journal: Nature Communications
doi: 10.1038/s41467-022-32518-3
Figure Legend Snippet: a Schematic illustration of electrospinning procedure for MPC textiles synthesis. Inset: Intermolecular interaction between MXene and PVDF; and 2 × 2 × 2 supercell of Sm-PMN-PT as a ceramic filler. b Scanning electron microscope (SEM) images and Energy-dispersive spectrometer (EDS) mapping spectra of Pb, F, and Ti elements in the as-prepared composite film. Scale bars: 200 nm. c High resolution SEM image of an as-electrospun single fiber. Scale bar: 5 nm. d C 1 s X-ray photoelectron spectrometer (XPS) spectra of as-prepared PT. e X-ray diffraction (XRD) spectra of undoped textiles and the prepared MPC textile with varying MXene mass fractions. f Frequency-dependent dielectric permittivity of fabricated MPC textile with diverse MXene mass fractions. g Frequency-dependent dielectric loss of fabricated MPC textile with diverse MXene mass fractions.
Techniques Used: Microscopy
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Microscopy:Article Title: High-performance piezoelectric composites via β phase programming Article Snippet: The chemical composition and valence states were characterized by X-ray photoelectron spectroscopy (XPS, model ESCALAB 250, Al Kα, hυ = 1486.6 eV).The chemical composition and valence states were characterized by X-ray photoelectron spectroscopy (XPS, model ESCALAB 250, Al Kα, hυ = 1486.6 eV).. The FTIR spectra were performed on Fourier infrared spectrometer ( Scanning Electron Microscopy:Article Title: High-performance piezoelectric composites via β phase programming Article Snippet: The chemical composition and valence states were characterized by X-ray photoelectron spectroscopy (XPS, model ESCALAB 250, Al Kα, hυ = 1486.6 eV).The chemical composition and valence states were characterized by X-ray photoelectron spectroscopy (XPS, model ESCALAB 250, Al Kα, hυ = 1486.6 eV).. The FTIR spectra were performed on Fourier infrared spectrometer ( X-Ray Photoelectron Spectroscopy:Article Title: High-performance piezoelectric composites via β phase programming Article Snippet: The chemical composition and valence states were characterized by X-ray photoelectron spectroscopy (XPS, model ESCALAB 250, Al Kα, hυ = 1486.6 eV).The chemical composition and valence states were characterized by X-ray photoelectron spectroscopy (XPS, model ESCALAB 250, Al Kα, hυ = 1486.6 eV).. The FTIR spectra were performed on Fourier infrared spectrometer ( X-ray Diffraction:Article Title: High-performance piezoelectric composites via β phase programming Article Snippet: The chemical composition and valence states were characterized by X-ray photoelectron spectroscopy (XPS, model ESCALAB 250, Al Kα, hυ = 1486.6 eV).The chemical composition and valence states were characterized by X-ray photoelectron spectroscopy (XPS, model ESCALAB 250, Al Kα, hυ = 1486.6 eV).. The FTIR spectra were performed on Fourier infrared spectrometer ( |